System and method for inspecting a workpiece surface by...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

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C356S237500, C356S600000

Reexamination Certificate

active

07605913

ABSTRACT:
A surface inspection system, as well as related components and methods, are provided. The surface inspection system includes a beam source subsystem, a beam scanning subsystem, a workpiece movement subsystem, an optical collection and detection subsystem, and a processing subsystem. The optical collection and detection system features, in the front quartersphere, a light channel assembly for collecting light reflected from the surface of the workpiece, and a front collector and wing collectors for collecting light scattered from the surface, to greatly improve the measurement capabilities of the system. The light channel assembly has a switchable edge exclusion mask and a reflected light detection system for improved detection of the reflected light.

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patent: 6201601 (2001-03-01), Vaez-Iravani et al.
patent: 6215551 (2001-04-01), Nikoonahad et al.
patent: 6292259 (2001-09-01), Fossey et al.
patent: 2003/0002791 (2003-01-01), Cao
patent: 2004/0246476 (2004-12-01), Bevis et al.

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