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Diagnosing or determining parameters for an installation for...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Differential optoacoustic absorption detector

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

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Diffractosight improvements

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Digital measuring scope with thermal compensation

Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent

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Digital signal processor knitting scanner

Optics: measuring and testing – Inspection of flaws or impurities – Textile inspection
Reexamination Certificate

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Diode light source for a line scan camera

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Disc-shaped recording medium inspection apparatus and method

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
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Discriminating surface contamination monitor

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Disk transfer mechanism, and disk inspection apparatus and...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Displacement measurement apparatus

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Distorted texture detecting method

Optics: measuring and testing – Inspection of flaws or impurities – Textile inspection
Patent

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Distortion inspection apparatus of a glass plate

Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent

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Double inspection of reticle or wafer

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Double inspection of reticle or wafer

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Double side polished wafer scratch inspection tool

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Double side polished wafer scratch inspection tool

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Double sided optical inspection of thin film disks or wafers

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Dual beam laser inspection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Dual collector optical flaw detector

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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Dual illumination apparatus for container inspection

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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