Disk transfer mechanism, and disk inspection apparatus and...

Details Disk transfer mechanism, and disk inspection apparatus and... Disk transfer mechanism, and disk inspection apparatus and...

2006-08-31

2009-11-10

Pham, Hoa Q (Department: 2886)

Optics: measuring and testing

Inspection of flaws or impurities

C360S031000, C369S053130

Reexamination Certificate

active

07616298

ABSTRACT:
The present invention is provided with a first and second spindle at respective initial positions spaced apart by a predetermined distance and disposed linearly at both sides of inspection positions where the spindles are set for disk inspection, a disk inverting mechanism is provided at either the front side or the back side of the inspection position, at the same time when a disk fitted to the first spindle is transferred to the inspection position, a disk fitted to the second spindle is returned from the inspection position to own initial position, and at the same time when a disk fitted to the second spindle is transferred to the inspection position, a disk fitted to the first spindle is returned from the inspection position to own initial position, and the disk fitted to the first spindle which is returned to the own initial position is delivered to the disk inverting mechanism, thereby an inverted disk is fitted to the second spindle.

REFERENCES:
patent: 5423111 (1995-06-01), Mori
patent: 5909117 (1999-06-01), Nakadai et al.
patent: 5999366 (1999-12-01), Shiraishi et al.
patent: 6122238 (2000-09-01), Langenskiold
patent: 7489394 (2009-02-01), Wienecke et al.
patent: 2008/0100286 (2008-05-01), Meder et al.
patent: 10-143861 (1998-05-01), None

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