Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent
1984-11-26
1987-03-03
McGraw, Vincent P.
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
250563, 250572, 358406, G01N 2188
Patent
active
046471979
ABSTRACT:
In a distortion inspection apparatus of a glass plate, a light and dark contrast pattern is sensed by an image sensor through a glass plate. The number of bits corresponding to a light or dark portion is detected from bipolar image data which are divided into a plurality of bits along each of parallel scanning lines assumed upon a surface of the glass plate. Then, a distortion state of the surface of the glass plate is discriminated in accordance with the differences among the thus detected number of bits and a reference value thereof. In such an arrangement, quantitative distortion discrimination can be performed.
REFERENCES:
patent: 2871756 (1959-02-01), Graves et al.
patent: 3688235 (1972-08-01), Migeotte
patent: 4076426 (1978-02-01), Gross et al.
patent: 4310242 (1982-01-01), Genco et al.
patent: 4461570 (1984-07-01), Task et al.
Ichise Nagayoshi
Kitaya Katsuhiko
Koren Matthew W.
McGraw Vincent P.
Nippon Sheet Glass Co. Ltd.
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