LandOfFree - US Patents - Listing for Optics: measuring and testing,Dimension,Thickness

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Depth and concentration estimation

Optics: measuring and testing – Dimension – Thickness

Reexamination Certificate

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Determining physical property of substrate

Optics: measuring and testing – Dimension – Thickness

Reexamination Certificate

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Determining wafer orientation in spectral imaging

Optics: measuring and testing – Dimension – Thickness

Reexamination Certificate

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Device and method for measuring the thickness of a...

Optics: measuring and testing – Dimension – Thickness

Reexamination Certificate

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Device for manufacturing semiconductor device and method of...

Optics: measuring and testing – Dimension – Thickness

Reexamination Certificate

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Device to determine the thickness of a conductive layer

Optics: measuring and testing – Dimension – Thickness

Reexamination Certificate

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Diffraction method for measuring thickness of a workpart

Optics: measuring and testing – Dimension – Thickness

Reexamination Certificate

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Diffraction method for measuring thickness of a workpart

Optics: measuring and testing – Dimension – Thickness

Reexamination Certificate

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Digital range sensor system

Optics: measuring and testing – Dimension – Thickness

Reexamination Certificate

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Displacement sensor

Optics: measuring and testing – Dimension – Thickness

Reexamination Certificate

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Dual photo-acoustic and resistivity measurement system

Optics: measuring and testing – Dimension – Thickness

Reexamination Certificate

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