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Parametric profiling using optical spectroscopic systems

Optics: measuring and testing – Dimension – Thickness
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Parametric profiling using optical spectroscopic systems to...

Optics: measuring and testing – Dimension – Thickness
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Planarizing machines and control systems for mechanical...

Optics: measuring and testing – Dimension – Thickness
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Positioning device for RAM testing system

Optics: measuring and testing – Dimension – Thickness
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Process and device for determining the thickness transverse...

Optics: measuring and testing – Dimension – Thickness
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Process and system for determination of layer thickness...

Optics: measuring and testing – Dimension – Thickness
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Process for continuous determination of the optical layer...

Optics: measuring and testing – Dimension – Thickness
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Processing waveform-based NDE

Optics: measuring and testing – Dimension – Thickness
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