Diffraction method for measuring thickness of a workpart

Optics: measuring and testing – Dimension – Thickness

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S626000

Reexamination Certificate

active

11135469

ABSTRACT:
The thickness of a workpart (10) is measured to a high degree of accuracy by passing a coherent light beam (20) through an aperture (16) in the workpart (10). The aperture (16′) can alternatively be created between an edge of the workpart (10) and an external reference plate (30). The light is diffracted on the far side of the workpart (10) and its diffraction pattern captured by a CCD camera (22). The captured image is analyzed by a computer (24) which compares the captured diffraction pattern to a stored referenced value to determine whether the thickness of the workpart (10) is within an acceptable range. The method is capable of returning measurements with micron or submicron resolution, and is a robust process readily adaptable to high volume production quality control applications.

REFERENCES:
patent: 3643101 (1972-02-01), Shipp et al.
patent: 3720471 (1973-03-01), Kasahara et al.
patent: 3937580 (1976-02-01), Kasdan
patent: 3957376 (1976-05-01), Charsky et al.
patent: 4247203 (1981-01-01), Levy et al.
patent: 4687328 (1987-08-01), Shiraishi et al.
patent: 4745295 (1988-05-01), Seno et al.
patent: 5103104 (1992-04-01), Tissier et al.
patent: 5264909 (1993-11-01), Rochester
patent: 5570188 (1996-10-01), Nevel et al.
patent: 5615012 (1997-03-01), Kazem-Goudarzi et al.
patent: 5615014 (1997-03-01), Okuda
patent: 5700671 (1997-12-01), Prieto et al.
patent: 5754294 (1998-05-01), Jones et al.
patent: 6333500 (2001-12-01), Gehring et al.
patent: 6346988 (2002-02-01), Bartunek et al.
patent: 6589603 (2003-07-01), Cornell et al.
patent: 6687015 (2004-02-01), Waller et al.
patent: 6791784 (2004-09-01), Edwards
patent: 7038207 (2006-05-01), Hwang
patent: 2001/0019407 (2001-09-01), Sato et al.
patent: 2002/0039184 (2002-04-01), Sandusky
patent: 2002/0089677 (2002-07-01), Ziegler et al.
patent: 2004/0009413 (2004-01-01), Lizotte

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Diffraction method for measuring thickness of a workpart does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Diffraction method for measuring thickness of a workpart, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Diffraction method for measuring thickness of a workpart will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3912321

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.