Diffraction method for measuring thickness of a workpart

Details Diffraction method for measuring thickness of a workpart Diffraction method for measuring thickness of a workpart

2008-07-15

2008-07-15

Lauchman, L. G. (Department: 2877)

Optics: measuring and testing

Dimension

Thickness

C356S626000

Reexamination Certificate

active

07400417

ABSTRACT:
The thickness of a workpart (10) is measured to a high degree of accuracy by passing a coherent light beam (20) through an aperture (16) in the workpart (10). The aperture (16′) can alternatively be created between an edge of the workpart (10) and an external reference plate (30). The light is diffracted on the far side of the workpart (10) and its diffraction pattern captured by a CCD camera (22). The captured image is analyzed by a computer (24) which compares the captured diffraction pattern to a stored referenced value to determine whether the thickness of the workpart (10) is within an acceptable range. The method is capable of returning measurements with micron or submicron resolution, and is a robust process readily adaptable to high volume production quality control applications.

REFERENCES:
patent: 3643101 (1972-02-01), Shipp et al.
patent: 3720471 (1973-03-01), Kasahara et al.
patent: 3937580 (1976-02-01), Kasdan
patent: 3957376 (1976-05-01), Charsky et al.
patent: 4247203 (1981-01-01), Levy et al.
patent: 4687328 (1987-08-01), Shiraishi et al.
patent: 4745295 (1988-05-01), Seno et al.
patent: 5103104 (1992-04-01), Tissier et al.
patent: 5264909 (1993-11-01), Rochester
patent: 5570188 (1996-10-01), Nevel et al.
patent: 5615012 (1997-03-01), Kazem-Goudarzi et al.
patent: 5615014 (1997-03-01), Okuda
patent: 5700671 (1997-12-01), Prieto et al.
patent: 5754294 (1998-05-01), Jones et al.
patent: 6333500 (2001-12-01), Gehring et al.
patent: 6346988 (2002-02-01), Bartunek et al.
patent: 6589603 (2003-07-01), Cornell et al.
patent: 6687015 (2004-02-01), Waller et al.
patent: 6791784 (2004-09-01), Edwards
patent: 7038207 (2006-05-01), Hwang
patent: 2001/0019407 (2001-09-01), Sato et al.
patent: 2002/0039184 (2002-04-01), Sandusky
patent: 2002/0089677 (2002-07-01), Ziegler et al.
patent: 2004/0009413 (2004-01-01), Lizotte

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