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Detected position correcting method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Detecting defects in plastic and similar surfaces

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Detecting irregularities in a coating on a substrate

Optics: measuring and testing – By polarized light examination
Patent

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Detecting multi-domain states in perpendicular magnetic media

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Detecting the orientation of carbon nanotubes

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Detection of birefringence in irregularly shaped objects

Optics: measuring and testing – By polarized light examination
Patent

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Detection of birefringent microcrystals in bile

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Detection of focal point of objective lens by means of a two-spl

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Detection of three-dimensional information using a projected poi

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Detection of three-dimensional information with a projected plan

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Detector configurations for optical metrology

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Detector configurations for optical metrology

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Detector configurations for optical metrology

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Detector configurations for optical metrology

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Detector configurations for optical metrology

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Detector configurations for optical metrology

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Determination of an optical parameter of an optical signal

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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Determination of coating adhesion

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Determination of induced change of polarization state of light

Optics: measuring and testing – By polarized light examination
Patent

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Determination of irradiation parameters for inspection of a...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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