System, and mathematical regression-based method utilizing optic

Details System, and mathematical regression-based method utilizing optic System, and mathematical regression-based method utilizing optic

1997-07-31

1998-11-10

Pham, Hoa O.

Optics: measuring and testing

By polarized light examination

Of surface reflection

356365, 356367, 250225, G01N 2121

Patent

active

058352228

ABSTRACT:
Disclosed is a system, and regression-based method utilizing optical data, for use in identifying material systems which have been cut to have an optical axis oriented as desired with respect to a alignment surface. The present invention is particularly well suited to qualification of material systems such as optical compensators and retarders, which ideally have an optical axis oriented perpendicular to, or parallel to, an alignment surface.

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Oriel Data Sheets for quartz & mica retarder.
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New Focus Data Sheet Titled "The Berek Polarization Compensator".
Berek Retarder Equation Sheet for Ideal Berek Retarder, provided by New Focus.
Excerpts from PH.D. Thesis of Mathias Schubert at Leipzig University in 1996.

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