Optics: measuring and testing – By polarized light examination
Patent
1998-06-01
1999-06-15
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
3562432, 356338, G01N 2100, G01J 102
Patent
active
059127376
ABSTRACT:
A system is described for verifying the calibration of a turbidimeter having a light source and a detector for scattered light. A first polarizer is positioned in the path of the light beam, and a second polarizer is positioned between the first polarizer and the detector. The first polarizer linearly polarizes the light beam and the second polarizer restricts the amount of light passing through it to reach the detector.
REFERENCES:
patent: 3177761 (1965-04-01), Redner
patent: 3627431 (1971-12-01), Komarniski
patent: 3653767 (1972-04-01), Liskowitz
patent: 3790289 (1974-02-01), Schmidt
patent: 3918817 (1975-11-01), Posgate
patent: 5250186 (1993-10-01), Dollinger et al.
Bannerjee Ashim K.
Stream Robert D.
Edmundson Dean P.
Hach Company
Pham Hoa Q.
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