Optics: measuring and testing – By polarized light examination
Patent
1999-02-16
1999-11-30
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
356 731, G01J 404
Patent
active
059952288
ABSTRACT:
A first tunable wavelength pulse light source is driven by a reference signal to emit a first optical pulse. An optical demultiplexer demultiplexes a first optical pulse emitted from the first pulse light source into a reference optical pulse and an incident optical pulse to be sent into an object to be measured. An optical multiplexer multiplexes the reference optical pulse and an outgoing optical pulse passing through the object to output multiplexed light. A second pulse light source generates a second optical pulse which is synchronous with the first optical pulse and delays a predetermined time for each period of the first optical pulse. A sampling unit receives the multiplexed light and the second optical pulse to obtain an optical pulse train signal proportional to the intensity of the multiplexed light obtained in synchronism with the second optical pulse. From the optical pulse train signal from the sampling unit, a signal processor obtains an envelope formed by peaks of individual optical pulses forming the optical pulse train. The wavelength dispersion of the object is obtained by measuring the delay time of the outgoing optical pulse passing through the object on the basis of intervals between the peaks of the envelope.
REFERENCES:
patent: 5227623 (1993-07-01), Heffner
patent: 5390018 (1995-02-01), Fujita et al.
patent: 5406368 (1995-04-01), Horiuchi et al.
patent: 5654793 (1997-08-01), Barlow et al.
patent: 5717489 (1998-02-01), Ozeki et al.
Patent Abstracts of Japan, Publication No. JP 04-177141, Published Jun. 24, 1992, Nippon Telegraph & Telephone Corp.
Patent Abstracts of Japan, Publication No. JP 06-174592, Published Jun. 24, 1994, Nippon Telephone & Telegraph Corp.
Kawanishi Satoki
Otani Akihito
Otsubo Toshinobu
Takara Hidehiko
Yamabayashi Yoshiaki
Anritsu Corporation
Nippon Telegraph and Telephone Corporation
Pham Hoa Q.
LandOfFree
Wavelength dispersion measuring apparatus and polarization dispe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Wavelength dispersion measuring apparatus and polarization dispe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wavelength dispersion measuring apparatus and polarization dispe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1680006