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System for locating relative positions of objects in three dimen

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for maintaining the cutting condition of double ground kn

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for measuring and detecting printed circuit wiring defect

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for measuring gap and mismatch between opposing parts

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for measuring irregularities of road surface

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for measuring of both circular and linear birefringence

Optics: measuring and testing – By polarized light examination
Reexamination Certificate

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System for measuring periodic structures

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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System for measuring polarimetric spectrum and other...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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System for measuring polarimetric spectrum and other...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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System for measuring surface flatness using shadow moire technol

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for measuring the position of a moving body

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for measuring the pressure sealed inside an envelope

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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System for non-destructive measurement of samples

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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System for optically measuring the surface contour of a part usi

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for performing ellipsometry using an auxiliary pump...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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System for point-by-point measuring of spatial coordinates

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for point-by-point measuring of spatial coordinates

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for positioning a body

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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System for reducing stress induced effects during...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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System for reducing stress induced effects during...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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