System for reducing stress induced effects during...

Details System for reducing stress induced effects during... System for reducing stress induced effects during...

2005-10-24

2008-03-25

Punnoose, Roy M (Department: 2886)

Optics: measuring and testing

By polarized light examination

Of surface reflection

C356S135000

Reexamination Certificate

active

07349092

ABSTRACT:
A system for determination of optical constants of liquids, including provision for reducing stress induced effects while obtaining data.

REFERENCES:
patent: 4076420 (1978-02-01), De Maeyer et al.
patent: 4159874 (1979-07-01), Dearth et al.
patent: 4472633 (1984-09-01), Motooka
patent: 4807994 (1989-02-01), Felch et al.
patent: 5313264 (1994-05-01), Ivarsson et al.
patent: 5329357 (1994-07-01), Bernoux et al.
patent: 5373359 (1994-12-01), Woollam et al.
patent: 5504582 (1996-04-01), Johs et al.
patent: 5521706 (1996-05-01), Green et al.
patent: 5582646 (1996-12-01), Woollam et al.
patent: 5625455 (1997-04-01), Nash et al.
patent: 5666201 (1997-09-01), Johs et al.
patent: 5706212 (1998-01-01), Thompson et al.
patent: 5757494 (1998-05-01), Green et al.
patent: 5872630 (1999-02-01), Johs et al.
patent: 5900633 (1999-05-01), Solomon et al.
patent: 5926284 (1999-07-01), Naya et al.
patent: 5991048 (1999-11-01), Karlson et al.
patent: 6034777 (2000-03-01), Johs et al.
patent: 6049220 (2000-04-01), Borden et al.
patent: 6200814 (2001-03-01), Malmqvist et al.
patent: 6316274 (2001-11-01), Herron et al.
patent: 6738139 (2004-05-01), Synowicki et al.
patent: 2002/0024668 (2002-02-01), Stehle et al.

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