System for measuring gap and mismatch between opposing parts

Details System for measuring gap and mismatch between opposing parts System for measuring gap and mismatch between opposing parts

1997-12-02

1999-12-07

Font, Frank G.

Optics: measuring and testing

By polarized light examination

With light attenuation

25055924, G01B 1129

Patent

active

059992654

ABSTRACT:
A system for measuring gap and mismatch by optical triangulation projects two parallel light planes onto the parts to be characterized so as to form two brightness lines. The three-dimensional profiles of the parts are calculated along the brightness lines. Raw values of gap and mismatch are calculated, preferably using particular reference points and lines. These raw values are then corrected by reference to the separation between the light planes and the change in position of a reference point of the profile of one of the parts from one brightness line to the other.

REFERENCES:
patent: 5129010 (1992-07-01), Higuchi et al.
patent: 5416590 (1995-05-01), Stover et al.
French Search Report dated Aug. 18, 1997.

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