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Phase shifting interferometer and method for surface topography

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Phase-locked loop laser gyroscope system

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Phase-locked loop laser gyroscope system

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Phase-modulated polarizing interferometer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Phase-sensitive interferometric mask-wafer alignment

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Phase-shifting point diffraction interferometer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Phase-shifting point diffraction interferometer focus-aid enhanc

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Phase-stepping fiber-optic projected fringe system for surface t

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Photoacoustic method and apparatus for measuring intensity of el

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Photodetector amplitude linearity

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Photodetector and spectrometer using the same

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate

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Photodiode array

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Photodiode array spectrometer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Photodiode array spectrometer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Photoelectric measuring apparatus for use in automatic analyzer

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Photoelectric measuring system with integrated optical circuit i

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Photoelectric position encoder using diffraction imagery

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Photoelectric position indicator with a light-directing phase gr

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Photoelectric position measuring system

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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Photoelectric position measuring system with integral optical ci

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
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