Photoelectric position measuring system

Details Photoelectric position measuring system Photoelectric position measuring system

1996-06-06

1997-11-18

Font, Frank G.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356345, 250237G, G01B 902

Patent

active

056893361

ABSTRACT:
A scanning grating is provided in a photoelectric position measuring system which has three areas per graduation period (d) arranged behind each other in the measuring direction. These areas B.sub.1, B.sub.2, B.sub.3 are structured transversely with respect to the measuring direction X in such a way that transversely diffracted light beams are directed on detectors D.sub.0, D.sub.1, D.sub.2 which are arranged transversely to the measuring direction X. The detectors generate signals which are phase-shifted with respect to each other.

REFERENCES:
patent: 5428445 (1995-06-01), Holzapfel
patent: 5648658 (1997-07-01), Holzapfel et al.

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