Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1997-02-28
1998-11-10
Turner, Samuel A.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356354, 356359, G01B 902
Patent
active
058352171
ABSTRACT:
Disclosed is a point diffraction interferometer for evaluating the quality of a test optic. In operation, the point diffraction interferometer includes a source of radiation, the test optic, a beam divider, a reference wave pinhole located at an image plane downstream from the test optic, and a detector for detecting an interference pattern produced between a reference wave emitted by the pinhole and a test wave emitted from the test optic. The beam divider produces separate reference and test beams which focus at different laterally separated positions on the image plane. The reference wave pinhole is placed at a region of high intensity (e.g., the focal point) for the reference beam. This allows reference wave to be produced at a relatively high intensity. Also, the beam divider may include elements for phase shifting one or both of the reference and test beams.
REFERENCES:
Kwon, Osak Y., "Multichannel Phase-shifted Interferometer," Reprinted with . . . permission from Optics Letters, vol. 9 (2), pp. 59-61,Feb. 1984, Palo Alto, California.
Mercer, Carolyn R. & Creath, Katherine, "Liquid-crystal Point-diffraction Interferometer," Optic Letters, vol. 19, No. 12, Jun. 15, 1994.
Medecki, H., et al., "A Phase-Shifting Point Diffraction Interferometer," Optics Letters, Oct. 1, 1996.
W. P. Linnik, Proceedings of the Academy of Sciences of the U.S.S.R. 1, 208 (1933).
R.N. Smartt, W.H. Steel, Japan. J. of Appl. Phys. 14, (Suppl. 14-1), 351 (1975).
K. A. Goldberg, R. Beguiristain, J. Bokor, H. Medecki, D. T. Attwood, K. Jackson, E. Tejnil, G. E. Sommargren, J. Vac. Sci. Tech. B 13, 2923 (1995) .
The Regents of the University of California
Turner Samuel A.
LandOfFree
Phase-shifting point diffraction interferometer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Phase-shifting point diffraction interferometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Phase-shifting point diffraction interferometer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1522250