Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1992-01-21
1993-07-20
Evans, F. L.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
2502521, G01J 302
Patent
active
052298388
ABSTRACT:
To calibrate a photodetector, a rotating disk with a slot is disposed in a light beam with decreasing speed from a defined maximum rotational speed to a defined minimum speed, while magnitudes and times of signals are read out and stored. Vernier pairs of signals occur in adjacent readout intervals, and non-vernier signals exclude the verniers. Readout times for verniers are used to estimate a preliminary function of rotations versus time. From the function are estimated an occurrence time for each pair and period of disk rotation at the time. Vernier fraction is the ratio of one signal in the pair to the sum of the pair. A time offset is the product of vernier fraction, slot fraction of the disk and the estimated period. Occurrence times corrected with the time offset are utilized to fit a corrected function of disk rotations versus time. Points of time for the non-vernier signals are determined from the corrected function, each point corresponding to disk rotations to a corresponding non-vernier signal. These points of time are employed with corresponding signals for linearly calibrating the photodetector.
REFERENCES:
"Automated High Precision Variable Aperture For Spectrophotometer Linearity Testing" by J. C. Zwinkels and D. S. Gignac, Applied Optics, 30, 1678-1687 (May 1, 1991).
Ganz Alan M.
Tracy David H.
Evans F. L.
Grimes E. T.
Ingham H. S.
The Perkin-Elmer Corporation
Wahl J. R.
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