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Method and device for monitoring electric components in a...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Method and devices for localizing flat chips on a carrier plate

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Method and machine for positioning an object photoelectrically u

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Method and system for determining the alignment of a surface...

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Method and system for overlay measurement

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Method and system for positioning an autonomous mobile unit...

Optics: measuring and testing – By alignment in lateral direction
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Method for achieving alignment between objects

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Method for actively aligning an optoelectronic device

Optics: measuring and testing – By alignment in lateral direction
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Method for adjusting a substrate in an appliance for...

Optics: measuring and testing – By alignment in lateral direction – With light detector
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Method for aligning a semiconductor chip to be repaired with a r

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method for aligning photomasks

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Method for aligning two objects

Optics: measuring and testing – By alignment in lateral direction – With light detector
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Method for aligning wafer

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Method for alignment in photolithographic processes

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method for calibrating surface mounting processes in printed cir

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Method for checking alignment accuracy using overlay mark

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Method for correcting alignment, method for manufacturing a...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Method for determining a straight line intersecting the axis of

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Method for determining rotational error portion of total...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
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Method for determining rotational error portion of total...

Optics: measuring and testing – By alignment in lateral direction – With light detector
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