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Disposable contact lens for use with an ophthalmic laser system

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Double sided wafer, alignment technique

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Double-sided circuit board exposure machine and method with opti

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Dynamic alignment of optical fibers to optical circuit...

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Edge overlay measurement target for sub-0.5 micron ground rules

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Efficient auto-alignment method for cylindrical laser...

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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EGA alignment method using a plurality of weighting coefficients

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Electronic component mounting apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Electronic device for determining a register error in multi-colo

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Electronic part installation apparatus and method thereof

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Elements aligning/coupling apparatus and method

Optics: measuring and testing – By alignment in lateral direction
Patent

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End cap incorporating laser alignment target

Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate

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Enhanced overlay measurement marks for overlay alignment and...

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Exposure apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Exposure apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Exposure apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Exposure apparatus

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Exposure apparatus

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Exposure apparatus and aligning method

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Exposure apparatus and aligning method

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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