Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent
1986-03-10
1989-05-09
Rosenberger, Richard A.
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
356356, 356363, G01B 902
Patent
active
048283924
ABSTRACT:
A reduction projection type alignment and exposure apparatus which comprises a light source, a reticle having a first grating, first lens system, a spatial filter disposed around a Fourier spectral plane of the first lens system, second lens system, a substrate having a second grating, and a plurality of photo-detectors for detecting light intensities of a plurality of spectrums appearing on the spatial filter.
The light beam generated from the light source is applied to the reticle at which it is divided into a plurality of diffracted light beams by the first grating, and the diffracted light beams are applied through the first lens system, the spatial filter and the second lens system onto the substrate so that the diffracted light beams are re-diffracted by the second grating, and the re-diffracted light beams appear as a plurality of spectrums on the spatial filter. These spectrums are detected by photo-detectors and used for alignment of the reticle and the substrate.
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Matsumura Takayoshi
Nomura Noboru
Yamaguchi Midori
Yamashita Kazuhiro
Matsushita Electric - Industrial Co., Ltd.
Rosenberger Richard A.
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