Environmental scanning probe microscope
Extensometer support
Factory-alignable compact cantilever probe
Feeler device for measuring surface roughness
Flexural probe and method for examining a moving sensitive...
Flexure-beam actuator and stage for micro- and nano-positioning
Force method for determining the spring constant of scanning...
Force method for determining the spring constant of scanning...
Force microscope and method for measuring atomic forces in multi
Force sensing integrated readout and active tip based probe...
Force sensing slider
Formation of a magnetic film on an atomic force microscope canti
Front-wing cantilever for the conductive probe of electrical...
Fully digital controller for cantilever-based instruments
Gas filled reactive atomic force microscope probe
Gauge for characterizing roller surface venting
Glide detect head with predictable asperity contact region
Glide head apparatus for testing recording media
Glide head assembly and method therefor
Glide head assembly and test device utilizing the same