Gas filled reactive atomic force microscope probe

Details Gas filled reactive atomic force microscope probe Gas filled reactive atomic force microscope probe

2007-10-09

2007-10-09

Larkin, Daniel S. (Department: 2856)

Measuring and testing

Surface and cutting edge testing

Roughness

Reexamination Certificate

active

11162958

ABSTRACT:
An atomic force microscope (AFM) having a hollowed cantilever ending in a hollowed tip is described, wherein the end of the tip is immersed in a liquid. The AFM includes a gas source that provides and controls the flow of gas into the hollowed tip. The flow rate of the gas is regulated to form and sustain a static bubble at the end of the hollowed tip. The formation of the static bubble is verified optically. A gas control manifold allows an easy switch of gasses that are fed into the probe tip. The gas that is introduced acts like a chemically modified tip, and is selected to increase the deflection signal for the material of interest. The tip of the present invention is a highly versatile AFM tool that is easily adjusted to provide optimized imaging for a wide variety of materials, in contrast with standard AFMs that require a plethora of chemically modified tips to obtain equivalent results. Moreover, there is a much lower propensity for the tip to damage the sample or to be damaged from inadvertent contact with the surface of the sample.

REFERENCES:
patent: 5025658 (1991-06-01), Elings et al.
patent: 5262643 (1993-11-01), Hammond et al.
patent: 6337479 (2002-01-01), Kley
patent: 6690008 (2004-02-01), Hantschel et al.

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