Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2006-04-06
2009-06-30
Larkin, Daniel S (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
Reexamination Certificate
active
07552625
ABSTRACT:
In accordance with an embodiment of the invention, there is a force sensor for a probe based instrument. The force sensor can comprise a detection surface and a flexible mechanical structure disposed a first distance above the detection surface so as to form a gap between the flexible mechanical structure and the detection surface, wherein the flexible mechanical structure is configured to deflect upon exposure to an external force, thereby changing the first distance.
REFERENCES:
patent: 5231286 (1993-07-01), Kajimura et al.
patent: 5245863 (1993-09-01), Kajimura et al.
patent: 5260567 (1993-11-01), Kuroda et al.
patent: 5465611 (1995-11-01), Ruf et al.
patent: 5689107 (1997-11-01), Hsu
patent: 5908981 (1999-06-01), Atalar et al.
patent: 6310990 (2001-10-01), Putnam et al.
patent: 6567572 (2003-05-01), Degertekin et al.
patent: 2004/0130728 (2004-07-01), Degertekin et al.
U.S. Appl. No. 11/352,535, filed Feb. 13, 2006.
U.S. Appl. No. 11/405,051, filed Apr. 17, 2006.
U.S. Appl. No. 11/297,097, filed Dec. 8, 2005.
U.S. Appl. No. 11/260,238, filed Oct. 28, 2005.
U.S. Appl. No. 11/476,625, filed Jun. 29, 2006.
U.S. Appl. No. 11/548,005, filed Oct. 10, 2006.
U.S. Appl. No. 11/548,531, filed Oct. 11, 2006.
U.S. Appl. No. 11/552,274, filed Oct. 24, 2006.
Bockhop Bryan W.
Bockhop & Associates LLC
Georgia Tech Research Corporation
Larkin Daniel S
LandOfFree
Force sensing integrated readout and active tip based probe... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Force sensing integrated readout and active tip based probe..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Force sensing integrated readout and active tip based probe... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4083269