Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2007-04-23
2009-10-27
Larkin, Daniel S (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
Reexamination Certificate
active
07607344
ABSTRACT:
A scanner which includes a gradient index lens for passing and focusing beams from a radiation emitter to a cantilevered member reflective surface of a probe and from the reflective surface to a radiation detector. The lens also serves as a mechanical support for attachment of the radiation emitter and the radiation detector and is also attached to a support for the cantilevered member. The resulting fixed positions of the radiation emitter and the radiation detector relative to the reflective cantilevered member surface allows the scanner to be compact and factory focally alignable.
REFERENCES:
patent: 5025658 (1991-06-01), Elings et al.
patent: 5189906 (1993-03-01), Elings et al.
patent: 5210409 (1993-05-01), Rowe
patent: 5260824 (1993-11-01), Okada et al.
patent: 5291775 (1994-03-01), Gamble et al.
patent: 5388452 (1995-02-01), Harp et al.
patent: 5406833 (1995-04-01), Yamamoto
patent: 5440920 (1995-08-01), Jung et al.
patent: 5481908 (1996-01-01), Gamble
patent: 5489774 (1996-02-01), Akamine et al.
patent: 5524479 (1996-06-01), Harp et al.
patent: 5587523 (1996-12-01), Jung et al.
patent: 5625142 (1997-04-01), Gamble
patent: 5714756 (1998-02-01), Park et al.
patent: 5717132 (1998-02-01), Watanabe et al.
patent: 5763767 (1998-06-01), Jung et al.
patent: 5874669 (1999-02-01), Ray
patent: 6021665 (2000-02-01), Hayashi et al.
patent: 6138503 (2000-10-01), Ray
patent: 6239426 (2001-05-01), Muramatsu et al.
patent: 6415654 (2002-07-01), Ray
patent: 6748794 (2004-06-01), Ray
patent: 6871527 (2005-03-01), Hansma et al.
patent: 6877365 (2005-04-01), Watanabe et al.
patent: 6878444 (2005-04-01), Suzuki et al.
patent: 6910368 (2005-06-01), Ray
patent: 7022985 (2006-04-01), Knebel et al.
patent: 7089787 (2006-08-01), Sahin et al.
patent: 7109703 (2006-09-01), Suzuki et al.
patent: 7170048 (2007-01-01), Kakemizu
patent: 7170054 (2007-01-01), Iyoki et al.
patent: 2005/0151536 (2005-07-01), Suzuki et al.
patent: 2006/0005614 (2006-01-01), Sahin et al.
patent: 2006/0075803 (2006-04-01), Boisen et al.
patent: 2006/0272398 (2006-12-01), Hwang et al.
patent: 2007/0044545 (2007-03-01), Beyder et al.
patent: 2007/0062265 (2007-03-01), Beyder et al.
A. Beyder and F. Sachs, “Microfabricated Torsion Levers Optimized for Low Force and High-Frequency Operation in Fluids,” Ultramicroscopy, 2006, pp. 838-846, vol. 106.
M. Viani et al, “Small Cantilevers for Force Spectroscopy of Single Molecules,” J. Appl. Phys., 1999, pp. 2258-2262, vol. 86 (4).
G. Binnig et al, “Atomic Force Microscope,” Physical Review Letters, 1986, pp. 930-933, vol. 56 (9).
D. Brayshaw et al, “Reducing a polymer to its Subunits as an Aid to Molecular Mapping,” Nanotechnology, 2004, pp. 1391-1396, vol. 15.
T. Fukuma et al, “True Molecular Resolution in Liquid by Frequency-Modulation Atomic Force Microscopy,” Appl. Phys. Lett., 2005, pp. 193108-1-3, vol. 86.
A. Gunning et al, “Watching Molecular Processes with the Atomic Force Microscope: Dynamics of Polymer Adsorption and Desorption at the Single Molecule Level,” J. Microscopy, 2004, pp. 52-56, vol. 216.
M. Kuhn et al, “Automated Alighment and Pattern Recognition of Single-Molecule Force Spectroscopy Data,” J. Microscopy, 2005, pp. 125-132, vol. 218.
D. Muller et al, “Surface Structures of Native Bacteriorhodopsin Depend on the Molecular Packing Arrangement in the Membrane,” J. Mol. Biol., 1999, pp. 1903-1909, vol. 285.
H. Janovjak et al, Abstract from “Molecular Force Modulation Spectroscopy Revealing the Dynamic Response of Single Bacteriorhodopsins,” Biophysical J., 2005, 1423-31, vol. 88.
S. Zou et al, Abstract from “Stretching and Rupturing Individual Supramolecular Polymer Chains by AFM,” Angewandte Chemie, Int. ed., 2005, pp. 956-959, vol. 44 (6).
Z. Lu et al, Abstract from “Elastic Properties of Single Amylose Chains in Water: A Quantum Mechanical and AFM Study,” J. Am. Chem. Soc., 2004, pp. 9033-9041, vol. 126 (29).
Y. Lyubchenko, Abstract from “DNA Structure and Dynamics: An Atomic Force Microscopy Study,” Cell Biochemistry and Biophysics, 2004, pp.75-98, vol. 41 (1).
W. Shi et al, Abstract from “Force Spectroscopy on Dendronized Poly(p-phenylene)s: Revealing the Chain Elasticity and the Interfacial Interaction,” Macromolecules, 2005, pp. 861-966, vol. 38 (3).
L. Ye et al, Abstract from “Study on the Morphology of the Hydrophobically Modified-Polyelectrolyte in Aqueous Solution by AFM measurements,” J. Appl. Polymer Sci., 2004, pp. 1175-1178, vol. 93 (3).
Q. Zhang et al, Abstract from “Direct Detection of Inter-Residue Hydrogen Bonds in Polysaccharides by Single-Molecule Force Spectroscopy,” Angewandte Chemie, International Edition, 2005, pp. 2723-2727, vol. 44 (18).
Larkin Daniel S
Simmons James C.
LandOfFree
Factory-alignable compact cantilever probe does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Factory-alignable compact cantilever probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Factory-alignable compact cantilever probe will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4065011