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Visualization imaging system for curvilinear structures

Image analysis – Applications – 3-d or stereo imaging analysis
Reexamination Certificate

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Visualization of a multi-dimensional data set acquired with a su

Image analysis – Applications – Biomedical applications
Patent

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Visualization of diagnostically irrelevant zones in a...

Image analysis – Applications – Biomedical applications
Reexamination Certificate

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Visualization of information with an established order

Image analysis – Applications – Biomedical applications
Reexamination Certificate

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Voice data processing for converting voice data into voice...

Image analysis – Applications – Biomedical applications
Reexamination Certificate

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Voice-output reading system with gesture-based navigation

Image analysis – Applications – Reading aids for the visually impaired
Patent

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Volume imaging system

Image analysis – Applications – Biomedical applications
Reexamination Certificate

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Volume of interest selection

Image analysis – Applications – Biomedical applications
Reexamination Certificate

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Volume visualization using tissue mix

Image analysis – Applications – Biomedical applications
Reexamination Certificate

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Volumetric data connecting apparatus and method

Image analysis – Applications – Biomedical applications
Reexamination Certificate

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Wafer aligning apparatus and related method

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Wafer color variation correcting method, selective wafer...

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Wafer edge inspection and metrology

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Wafer edge inspection and metrology

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Wafer inspecting apparatus

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Wafer inspection apparatus

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Wafer map analysis aid system, wafer map analyzing method and wa

Image analysis – Applications – Manufacturing or product inspection
Patent

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Wafer mapping apparatus and method

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Wafer prober having an emissive display inspection system and me

Image analysis – Applications – Manufacturing or product inspection
Patent

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Wafer reader including a mirror assembly for reading wafer scrib

Image analysis – Applications – Manufacturing or product inspection
Patent

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