Image analysis – Applications – Manufacturing or product inspection
Patent
1996-12-02
1999-12-28
Kelley, Christopher S.
Image analysis
Applications
Manufacturing or product inspection
382141, 382144, 382284, G06K 900
Patent
active
060091878
ABSTRACT:
An inspection system (20) has an image capture device (10) that is mounted onto a wafer prober (15) for the electrical verification of electronic components (60) having an emissive display (61). The image capture device (10) includes a lens (31) that collects the image generated by the emissive display (61). The image is passed to mirrors (36,37) which redirect a portion of the image into a pickup device (41). The emissive display (61) is partitioned into subregions (62-65) to facilitate the capturing of the image. As the image of each of the subregions (62-65) is collected by image capture device (10), the other subregions (62-65) are deactivated.
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Angelo Anthony
Lebeau Christopher J.
Lehnen David C.
Novis Scott R.
Chawan Sheela
Dover Rennie William
Kelley Christopher S.
Motorola Inc.
Seddon Kenneth M.
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