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Large-scale integrated circuit with integral bi-directional test

Electricity: measuring and testing – Plural – automatically sequential tests
Patent

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Latch strobe generator circuit

Electricity: measuring and testing – Plural – automatically sequential tests
Patent

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Lead frame short tester

Electricity: measuring and testing – Plural – automatically sequential tests
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Linear feedback shift register for circuit design technology val

Electricity: measuring and testing – Plural – automatically sequential tests
Patent

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Linear ramping digital-to-analog converter for integrated...

Electricity: measuring and testing – Plural – automatically sequential tests
Reexamination Certificate

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Linear ramping digital-to-analog converter for integrated...

Electricity: measuring and testing – Plural – automatically sequential tests
Reexamination Certificate

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Loading apparatus for testing a power supply

Electricity: measuring and testing – Plural – automatically sequential tests
Patent

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Local area network protocol analyzer

Electricity: measuring and testing – Plural – automatically sequential tests
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Logic analyzer

Electricity: measuring and testing – Plural – automatically sequential tests
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Logic analyzer for integrated circuits, microcomputers, and the

Electricity: measuring and testing – Plural – automatically sequential tests
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Logic analyzer having a plurality of sampling channels

Electricity: measuring and testing – Plural – automatically sequential tests
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Logic circuit having a test data scan circuit

Electricity: measuring and testing – Plural – automatically sequential tests
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Logic circuit having testability for defective via contacts

Electricity: measuring and testing – Plural – automatically sequential tests
Patent

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Logic circuit test system

Electricity: measuring and testing – Plural – automatically sequential tests
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Logic network test system with simulator oriented fault test gen

Electricity: measuring and testing – Plural – automatically sequential tests
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LSI logic circuit

Electricity: measuring and testing – Plural – automatically sequential tests
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