Electricity: measuring and testing – Plural – automatically sequential tests
Patent
1977-03-01
1980-03-25
Tokar, Michael J.
Electricity: measuring and testing
Plural, automatically sequential tests
324158F, G01R 1512
Patent
active
041952588
ABSTRACT:
An improvement for a logic state analyzer which is used for testing or analyzing microcomputers employing different microprocessors or other integrated circuits such as memories. A universal clip connector is coupled to the connector pins of the integrated circuit package. The analyzer's memory stores the pin-signal relationship for each integrated circuit which engages the clip connector. A selection means is employed with this memory to select the signals required by the analyzer. The analyzer is then able, by way of example, to select the data bits on different microprocessors even though these bits are coupled to different pins in each processor. In this manner, microcomputers employing different microprocessors may be tested or analyzed without probe or lead changes, or other hardware changes.
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Intel Corporation
Tokar Michael J.
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