Logic circuit test system

Details Logic circuit test system Logic circuit test system

1984-05-31

1986-04-15

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

371 25, G01R 3128, G06F 1104

Patent

active

045830410

ABSTRACT:
A test system for simultaneously testing a plurality of logic circuits first sets them all to an initial state before beginning testing. The faulty logic circuits which cannot be set to the initial state can be identified, and the testing of the others can proceed, even after only one cycle of attempting to initialize all the logic circuits. If all the logic circuits are faulty, the further testing can be prevented.

REFERENCES:
patent: 4097797 (1978-06-01), Finet
patent: 4176780 (1979-12-01), Sacher et al.

Affiliated with

Also associated with

Rating

Logic circuit test system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Logic circuit test system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Logic circuit test system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1441514