Lead frame short tester

Details Lead frame short tester Lead frame short tester

1988-04-04

1989-05-23

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Plural, automatically sequential tests

324 57Q, 324158F, 324158P, 324546, G01R 3102, G01R 3300

Patent

active

048333964

ABSTRACT:
Disclosed herein is a method and apparatus for performing a non-invasive electronic testing of hybrid circuit packages before components are mounted within the package and connected to the outwardly extending wired leads. The testing process disclosed herein includes passing a pair of adjacent lead wires over an energized test loop or coil that is etched upon a coil board. The coil board is mounted on a mouting plate and the entire assembly is connected to the terminals of a Q-meter. As the circuit package under test is passed over the wire-shaped open loop, those pairs of adjacent wires which are shorted will indicate a low Q. On the other hand, those adjacent wires thatr are not shorted to each other in the package body will indicate a higher Q.

REFERENCES:
patent: 3155897 (1964-11-01), Rice
patent: 3303400 (1967-02-01), Allison
patent: 3348147 (1967-10-01), Erath
patent: 3719883 (1973-03-01), Pentecost
patent: 4023102 (1977-05-01), Barrow et al.
patent: 4377782 (1983-03-01), Metcalf et al.

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