Large-scale integrated circuit with integral bi-directional test

Details Large-scale integrated circuit with integral bi-directional test Large-scale integrated circuit with integral bi-directional test

1977-05-31

1979-12-25

Corcoran, Robert J.

Electricity: measuring and testing

Plural, automatically sequential tests

G01R 1512

Patent

active

041807723

ABSTRACT:
A large scale integrated circuit with external integral access test circuitry having a semiconductor body with a surface. A large scale integrated circuit is formed in the semiconductor body through the surface and comprises a large number of interconnected circuit elements with a large number of input and output pads connected to the circuit elements and disposed near the outer perimeter of the semiconductor body. An integrated test circuit is formed in the semiconductor body and extends through the surface. The integrated test circuit has a plurality of probe pads carried by the semiconductor body and connected to the test circuit. The integrated test circuit is formed external of but in relatively close proximity to the large scale integrated circuit. Leads are provided on the semiconductor body which connect the integrated test circuit to the large scale integrated circuit whereby access can be obtained to the large scale integrated circuit through probing of the probe pads of the integrated test circuit to ascertain the characteristics of the large scale integrated circuit.

REFERENCES:
patent: 3781683 (1973-12-01), Freed
Savkar, A. D.; N. Way Testpoint for Complex LSI Design; IBM Tech. Bull.; vol. 14; No. 10; Mar. 1972; pp. 2937-2938.
Barnard et al., Shift Register Tester on a Chip; IBM Tech. Bull.; vol. 15, No. 9, Feb. 1973; pp. 2935-2936.
Muehldorf, E. I.; Printed Circuit Card Incorporating Circuit Test Register; IBM Tech. Bull,; vol. 16; No. 6; Nov. 1973; p. 1732.
Jadus et al., Test Pad Multiplexing; IBM Tech. Bull.; vol. 18; No. 7, Dec. 1975; pp. 2181-2182.

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