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Chip-mounted contact springs

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chip-on-chip testing using BIST

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chip-scale package for integrated circuits

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chuck for holding a device under test

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Chuck for holding a device under test

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chuck for holding a device under test

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Chuck for supporting and retaining a test substrate and a...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Chuck with integrated wafer support

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Chuck with integrated wafer support

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Chuck with integrated wafer support

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Circuit analysis and manufacture using electric...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Circuit analysis using electric field-induced effects

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Circuit analyzer with component testing capability

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Circuit and a method for configuring pad connections in an integ

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Circuit and a method for configuring pad connections in an integ

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Circuit and a method for configuring pad connections in an...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Circuit and method for accurately applying a voltage to a...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Circuit and method for automatic measurement and...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Circuit and method for component communication

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Circuit and method for detecting a dielectric breakdown fault

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
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