Circuit and a method for configuring pad connections in an integ

Details Circuit and a method for configuring pad connections in an integ Circuit and a method for configuring pad connections in an integ

1998-07-13

2000-09-19

Karlsen, Ernest

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

714733, G01R 3128

Patent

active

061217859

ABSTRACT:
An integrated device includes a configuration circuit that is coupled to first and second bond pads and first and second conductive paths of the integrated device. The circuit receives a map signal that has a first value during a first operational mode of the integrated device and a second value during a second operational mode of the integrated device. In response to the first value, the circuit couples the first pad to the second conductive path. In response to the second value, the circuit couples the first pad to the first conductive path and the second pad to the second conductive path. The first operational mode may be a wafer test mode.

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