Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-05-02
2006-05-02
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S763010, C324S765010
Reexamination Certificate
active
07038482
ABSTRACT:
An automatic transistor threshold measuring circuit (100) can include a current source circuit (102) that can provide increasing amounts of current to a measured transistor (N1) according to current setting values (ICODE). When a gate-to-source voltage of measured transistor (N1) essentially equals a first reference voltage (Vref1), the current setting values (ICODE) is stored. The process is repeated with a second reference voltage (Vref1) to acquire a second current setting value (ICODE) A threshold voltage for the measured transistor (N1) can be calculated according to the reference voltages (Vref1and Vref2) and stored current setting values (ICODE).
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Cypress Semiconductor Corporation
Sako Bradley T.
Tang Minh N.
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