Apparatus for measuring capacitance of a semiconductor device

Apparatus for measuring characteristics of electronic parts

Apparatus for measuring current and other parameters of an elect

Apparatus for measuring minority carrier lifetimes in semiconduc

Apparatus for measuring of thin dielectric layer properties...

Apparatus for measuring on-chip characteristics in...

Apparatus for measuring properties of probe card and probing...

Apparatus for measuring resistance of electronic component

Apparatus for measuring temperature parameters of an ISFET...

Apparatus for measuring the focus of a light exposure system...

Apparatus for measuring the life time of minority carriers of a

Apparatus for measuring the static parameters of integrated...

Apparatus for measuring voltage fluctuation waveform in...

Apparatus for monitoring a device powered by the apparatus,...

Apparatus for monitoring degradation of insulation of electrical

Apparatus for monitoring earth faults on the rotor winding of a

Apparatus for monitoring phase voltages of a polyphase tachomete

Apparatus for obtaining planarity measurements with respect...

Apparatus for obtaining planarity measurements with respect...

Apparatus for performing a function on an integrated circuit