Apparatus for measuring voltage fluctuation waveform in...

Details Apparatus for measuring voltage fluctuation waveform in... Apparatus for measuring voltage fluctuation waveform in...

2005-01-25

2005-01-25

Tokar, Michael (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

06847222

ABSTRACT:
An apparatus measures a voltage fluctuation waveform in a semiconductor integrated circuit having a large number of wiring layers and being operated on a lower voltage without a destructive inspection. For this propose, the apparatus includes a power-source-system waveform converting circuit, disposed close to a functional circuit and in the LSI and operated on a second rated voltage higher than a first rated voltage, for converting the voltage fluctuation waveform of the power source system into an electrical current waveform; a pad for outputting the electric current waveform outside the LSI; and a wiring, arranged in the LSI, for connecting the power-source-system waveform converting circuit and the pad. The apparatus is used to measure a voltage fluctuation waveform near a particular circuit in operation included in, for example, a CMOS LSI.

REFERENCES:
patent: 6737880 (2004-05-01), Samaan et al.
patent: 6747470 (2004-06-01), Muhtaroglu et al.
patent: 2001-59855 (2001-03-01), None

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