Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-05-02
2008-08-05
Nguyen, Ha (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB, C714S731000, C713S152000, C368S107000
Reexamination Certificate
active
07408371
ABSTRACT:
An apparatus for measuring on-chip characteristics in a semiconductor circuit is provided. The apparatus for measuring the on-chip characteristics includes an oscillation unit, a timing test unit, and a selection unit. The oscillation unit is configured to selectively output a first oscillation signal responsive to a first control signal. The timing test unit is configured to generate a second oscillation signal using an input clock signal, generate a pulse from the second oscillation signal responsive to a second control signal, and determine whether an operating time violation has occurred based on a comparison of the second oscillation signal and the pulse. The selection unit is configured to select one of the output of the oscillation unit and the output of the timing test unit responsive to a test mode signal. The apparatus is configured to measure an on-chip delay using a period of the first oscillation, or to measure a timing margin of the semiconductor circuit using an output of the timing test unit, based on an output of the selection unit.
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Kang Shin-Mo
Kim Tak-Yung
Lee Jin-Yong
Chan Emily
Myers Bigel & Sibley Sajovec, PA
Nguyen Ha
Samsung Electronics Co,. Ltd.
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