LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing,Testing system

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Methods and apparatus for integrated storage of test environment

Data processing: measuring – calibrating – or testing – Testing system

Patent

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Methods and apparatus for optimizing lists of waveforms

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Methods and apparatus for producing an IC identification number

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Methods and apparatus for semiconductor testing

Data processing: measuring – calibrating – or testing – Testing system

Reexamination Certificate

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Methods and apparatus for statistical process control of test

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Methods and apparatus for testing a clock signal

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Methods and apparatus for testing a link between chips

Data processing: measuring – calibrating – or testing – Testing system – Including specific communication means

Reexamination Certificate

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Methods and apparatus for testing a link between chips

Data processing: measuring – calibrating – or testing – Testing system – Including specific communication means

Reexamination Certificate

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Methods and apparatus for testing dynamic network firewalls

Data processing: measuring – calibrating – or testing – Testing system – Including specific communication means

Reexamination Certificate

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Methods and apparatus for testing electronic devices

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Methods and apparatus for using black box data to analyze...

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system

Reexamination Certificate

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Methods and apparatus for using black box data to analyze...

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system

Reexamination Certificate

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Methods and apparatus for using black box data to analyze...

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system

Reexamination Certificate

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Methods and circuits for measuring clock skew on...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping

Reexamination Certificate

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Methods and devices for performing impedance spectroscopy

Data processing: measuring – calibrating – or testing – Testing system

Reexamination Certificate

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Methods and devices for the relevancy testing of an identifier

Data processing: measuring – calibrating – or testing – Testing system – Including specific communication means

Reexamination Certificate

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Methods and structure for maintaining state information to...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Methods and systems for asynchronously testing a plurality...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Methods and systems for enhanced automated system testing

Data processing: measuring – calibrating – or testing – Testing system – Including multiple test instruments

Reexamination Certificate

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Methods and systems for enhanced automated system testing

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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