Data processing: measuring – calibrating – or testing – Testing system
Reexamination Certificate
2005-04-26
2005-04-26
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
C702S124000, C324S447000
Reexamination Certificate
active
06885960
ABSTRACT:
A highly time resolved impedance spectroscopy that enhances the measurement of the dynamics of non-stationary systems with enhanced time resolution. The highly time resolved impedance spectroscopy includes an optimized, frequency rich a.c., or transient, voltage signal is used as the perturbation signal, non-stationary time to frequency transformation algorithms are used when processing the measured time signals of the voltage and current to determine impedance spectra which are localized in time; and the system-characterizing quantities are determined from the impedance spectra using equivalent circuit fitting in a time-resolution-optimized form. Methods and apparatus for processing impedance spectra data are also provided.
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Wagner Peter
Wiegand Gerald
Bui Bryan
Klarquist & Sparkman, LLP
Walling Meagan S
Zyomyx, Inc.
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