Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
Reexamination Certificate
2005-03-01
2005-03-01
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Signal generation or waveform shaping
C702S117000, C374S170000, C340S870160, C324S765010, C712S010000, C712S015000, C327S156000, C327S159000, C327S160000, C710S305000, C710S306000, C710S308000, C710S309000
Reexamination Certificate
active
06862548
ABSTRACT:
Described are methods for accurately measuring the skew of clock distribution networks on programmable logic devices. Clock distribution networks are modeled using a sequence of oscillators formed on the device using configurable logic. Each oscillator includes a portion of the network, and consequently oscillates at a frequency that depends on the signal propagation delay associated with the included portion of the network. The various oscillator configurations are defined mathematically as the sum of a series of delays, with the period of each oscillator representing the sum. The respective equations of the oscillators are combined to solve for the delay contribution of the included portion of the clock network. The delay associated with the included portion of the clock network can be combined with similar measurements for other portions of the clock network to more completely describe the network.
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Behiel Arthur J.
Bhat Aditya
Liu Justin
Xilinx , Inc.
Young Edel M.
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