Methods and apparatus for optimizing lists of waveforms

Details Methods and apparatus for optimizing lists of waveforms Methods and apparatus for optimizing lists of waveforms

2006-03-07

2006-03-07

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S117000, C702S066000, C714S738000

Reexamination Certificate

active

07010453

ABSTRACT:
A list of waveforms is received (the list being one that is to be driven to or received from a pin of a device under test). The list of waveforms is de-interleaved to form lists of non-interleaved waveforms. Each list of non-interleaved waveforms is then optimized by combining at least two of its entries. By way of example, the above method may be implemented by program code stored on a number of computer readable media, or by a circuit tester having program code for implementing same.

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Andrew Steven Hildebrant, “Methods and Apparatus for Optimizing the Masking of Waveforms to Reduce the Number of Waveforms in a list of Waveforms”, Filed Oct. 14, 2003, New U.S. Patent Application, 21 pages of specification and three- (3) sheets of drawings (Figs. 1-6), U.S. Appl. No. 10/686,376.

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