LandOfFree - US Patents - Listing for Data processing: measuring, calibrating, or testing,Testing system

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Enhanced testing for compliance with universal plug and play...

Data processing: measuring – calibrating – or testing – Testing system – Including multiple test instruments

Reexamination Certificate

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Enhanced testing for compliance with universal plug and play...

Data processing: measuring – calibrating – or testing – Testing system – Including multiple test instruments

Reexamination Certificate

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Enhancing voltmeter functionality

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Error detection apparatus and method and signal extractor

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Estimation of average-case activity for circuit elements in...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Estimation of average-case activity for digital state machines

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Evaluating test actions

Data processing: measuring – calibrating – or testing – Testing system

Reexamination Certificate

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Evaluation of device driver output

Data processing: measuring – calibrating – or testing – Testing system

Reexamination Certificate

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Evaluation of device driver output

Data processing: measuring – calibrating – or testing – Testing system

Reexamination Certificate

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Event based IC test system

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Event pipeline and summing method and apparatus for event...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Expert analysis modules for machine testing

Data processing: measuring – calibrating – or testing – Testing system – Including specific communication means

Reexamination Certificate

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Externally controllable electronic test program

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Fail analysis device

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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Fast method and apparatus for nonlinearly transforming mean and

Data processing: measuring – calibrating – or testing – Testing system – For transfer function determination

Patent

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Fast test application switching method and system

Data processing: measuring – calibrating – or testing – Testing system – Including program set up

Reexamination Certificate

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Fast, low power formatter for automatic test system

Data processing: measuring – calibrating – or testing – Testing system

Reexamination Certificate

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Fault diagnosis apparatus

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system

Reexamination Certificate

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Fault diagnosis apparatus

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system

Reexamination Certificate

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Fault diagnosis apparatus

Data processing: measuring – calibrating – or testing – Testing system – Of mechanical system

Reexamination Certificate

[ 0.00 ] – not rated yet Voters 0 Comments 0

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