Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-01-19
2008-10-07
Lau, Tung S. (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S118000, C702S108000, C324S500000, C324S537000, C324S763010, C324S765010, C714S718000, C714S719000, C714S735000, C714S736000, C714S819000, C714S824000, C365S189011, C365S201000
Reexamination Certificate
active
07433793
ABSTRACT:
A modulated voltage signal modulated at a predetermined frequency f0is supplied to an integrated circuit under test to be tested set at an arbitrary stationary point, and an observation signal containing information on power supply current flowing through the integrated circuit under test at the stationary point. Then, a determination signal from which DC component is removed is extracted from the observation signal and supplied to a determination device. The determination device compares the size of spectral component of the determination signal at the predetermined frequency f0between each measurement point and determines that an error exists in the integrated circuit under test if a difference is a predetermined value or greater.
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patent: 6995554 (2006-02-01), Loke et al.
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patent: 2003-185698 (2003-07-01), None
Kundu Sujoy K
Lau Tung S.
NEC Electronics Corporation
Sughrue & Mion, PLLC
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