Externally controllable electronic test program

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

10141717

ABSTRACT:
Disclosed is a product that provides a test executive program for controlling tests on a device under test that is separate and distinct from the test executive system. The product may be embodied in a media storing instructions that direct a processing unit to 1) perform an electronic test on the device under test, 2) provide an interface for communicating with an external system that is distinct from the test executive program, and for permitting the test system to be operated by the external system, 3) communicate with the external system, and 4) in response to signals generated by the external system, operate the test system. Other test executive methods and apparatus are also disclosed.

REFERENCES:
patent: 6002992 (1999-12-01), Pauwels et al.
patent: 6128759 (2000-10-01), Hansen
patent: 6449744 (2002-09-01), Hansen
patent: 6968302 (2005-11-01), Ahrens et al.
patent: 7050921 (2006-05-01), Sutton
patent: 2003/0093728 (2003-05-01), Sutton
patent: 2003/0097233 (2003-05-01), Sutton et al.
patent: 1 314 989 (2003-05-01), None
patent: 1 361 447 (2003-11-01), None
patent: 2003-330750 (2003-11-01), None
patent: WO 99 47937 (1999-09-01), None
National Instruments, “TestStand—A Complete Test Executive Environment,” National Instruments, p. 55-60 (Mar. 2000).
“LabviewUser Manual” [online], Nov. 2001, National Instrument XP002260913, Retrieved on Oct. 28, 2003, Retrieved from the Internet: <URL: http://www.ni.com/pdf/manuals/32099d.pdf>, Nov. 2001.
Butler, H. “Virtual Remote: The Centralized Expert”, 1266 Hewlett-Packard Journal, Hewlett-Packard Co., Palo Alto, US, vol. 45, No. 5, Oct. 1, 1994, pp. 75-82, XP000471161.
Fertitta K.G. et al: “The Role of Activex and Com in Ate”, Autotestcon 1999, IEEE Systems Readiness Technology Conference, 1999, IEEE San Antonio, TX, USA, Aug. 30, 1999-Sep. 2, 1999, Piscataway, NJ, USA, IEEE, US, Aug. 30, 1999, pp. 35-51, XP010356128.
“Getting Started with Labview”; Jul. 2000; National Instruments Corporation; pp. 1-1, 1-2, 3-1 through 3-7, 5-2, A-1 and A-2.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Externally controllable electronic test program does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Externally controllable electronic test program, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Externally controllable electronic test program will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3895470

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.