Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-03-07
2006-03-07
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S118000, C702S124000, C714S724000
Reexamination Certificate
active
07010452
ABSTRACT:
An event pipeline and vernier summing apparatus for high speed event based test system processes the event data to generate drive events and strobe events with various timings at high speed to evaluate a semiconductor device under test. The event pipeline and vernier summing apparatus is configured by an event count delay logic, a vernier data decompression logic, an event vernier summation logic, an event scaling logic, and a window strobe logic. The event pipeline and summing method and apparatus of the present invention is designed to perform high speed event timing processing with use of a pipeline structure. The window strobe logic provides a function for detecting a window strobe request and generating a window strobe enable.
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Gomes Glen
Le Anthony
Advantest Corp.
Muramatsu & Associates
Wachsman Hal
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