Fail analysis device

Details Fail analysis device Fail analysis device

2006-07-18

2006-07-18

Assouad, Patrick J. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C365S201000, C714S718000, C714S719000, C324S537000, C324S765010

Reexamination Certificate

active

07079971

ABSTRACT:
A fail analysis device enabling a simplified operation and a reduced operation time. A reduced data acquiring section (40) reads a reduced logical data, obtained by reducing detailed logical data as a test result, from a CFM (120) in a semiconductor test device (100) and acquires it. A main viewer generating section (80) generates a main viewer window including a list of a test result for each DUT based on the reduced logical data for displaying on a display device (94). The list includes a result image indicating a pass/fail for each DUT and the reduced image of a fail bit map.

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