Data processing: measuring – calibrating – or testing – Testing system
Reexamination Certificate
2011-07-26
2011-07-26
Nghiem, Michael P (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
C702S110000, C702S117000, C702S120000
Reexamination Certificate
active
07987063
ABSTRACT:
Automated test equipment (ATE) used to test semiconductor components during the manufacturing process. The ATE generates and measures signals at test points of a device under test. The ATE includes a signal formatter with an SR latch having set an reset inputs each connected through or coupled to a number of signal channels. Each signal channel may receive a long pulse from a timing generator and generate a short pulse. Each signal channel has a current steering circuit that couples the short pulses to the set or reset ports of the latch. Because the outputs of each current steering circuit have a high impedance when not sending a pulse, multiplexing circuitry and/or circuitry to logically OR the outputs of separate signal channels are unnecessary. The hardware eliminated by this design simplifies and improves the ATE. Additionally, the latch can be set and reset in quick succession with good timing resolution.
REFERENCES:
patent: 4686391 (1987-08-01), Gudaitis
patent: 4807147 (1989-02-01), Halbert et al.
patent: 5270582 (1993-12-01), Brown et al.
patent: 5280486 (1994-01-01), Arkin et al.
patent: 5428626 (1995-06-01), Frisch et al.
patent: 5604751 (1997-02-01), Panis
patent: 5854797 (1998-12-01), Schwartz et al.
patent: 6291981 (2001-09-01), Sartschev
patent: 6687865 (2004-02-01), Dervisoglu et al.
patent: 6771061 (2004-08-01), Sartschev et al.
patent: 6831473 (2004-12-01), Iorga
patent: 6894552 (2005-05-01), Iorga et al.
patent: 7222041 (2007-05-01), Iorga
Abrosimov Igor
Coyne David
Nghiem Michael P
Suarez Felix E
Teradyne, Inc.
Wolf Greenfield & Sacks P.C.
LandOfFree
Fast, low power formatter for automatic test system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Fast, low power formatter for automatic test system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Fast, low power formatter for automatic test system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2647990