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High speed electron beam lithography pattern processing system

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Instrument with interface for synchronization in automatic...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Instrument with interface for synchronization in automatic...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Interpolator testing system

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Low power scan testing techniques and apparatus

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Measuring apparatus and program

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method and apparatus for adjusting pin driver charging and disch

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method and apparatus for dynamically adjusting the...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method and apparatus for generating an electronic test signal

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method and apparatus for high-speed synchronous digital...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method and apparatus for managing timestamps when storing data

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method and device for inspecting an object using a time...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method and device for monitoring the function of an output...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method and system for evaluating timing in an integrated...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method and system of automatic bandwidth detection

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method and system of automatic bandwidth detection

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method and systems to measure propagation delay in...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method for characterizing high-frequency mixers

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method for controlling a test mode of an electric device

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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Method for sourcing three level data from a two level tester...

Data processing: measuring – calibrating – or testing – Testing system – Signal generation or waveform shaping
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